发明名称 Non-volatile semiconductor memory device controlling the range of distribution of memory cell threshold voltages
摘要 A non-volatile semiconductor memory device according to the invention comprises a memory cell array having a plurality of non-volatile memory cells, and a write state machine controlling a voltage applied to a memory cell selected from the memory cell array and a voltage application period, in accordance with each of reading of data from the selected memory cell, writing of data into the selected memory cell, and erasion of data from the selected memory. The write state machine executes writing, under a first writing condition, on a predetermined number of memory cells included in the memory cell array, and executes writing on memory cells other than the predetermined number of memory cells, under a second writing condition set in accordance with a result of the writing executed under the first writing condition.
申请公布号 US6434054(B1) 申请公布日期 2002.08.13
申请号 US20020040383 申请日期 2002.01.09
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SHIGA HITOSHI;TANZAWA TORU;SAITO MASANOBU
分类号 G11C16/02;G11C16/04;G11C16/16;G11C16/34;(IPC1-7):G11C16/16 主分类号 G11C16/02
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