发明名称 |
Method of forming a well isolation bipolar transistor |
摘要 |
The present invention relates to an integrated circuit including a lateral well isolation bipolar transistor. A first portion of the upper internal periphery of the insulating well is hollowed and filled with polysilicon having the same conductivity type as the transistor base, to form a base contacting region. A second portion of the upper internal periphery of the insulating well is hollowed and filled with polysilicon having the same conductivity type as the transistor emitter, to form an emitter contacting region.
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申请公布号 |
US6432789(B2) |
申请公布日期 |
2002.08.13 |
申请号 |
US20000726939 |
申请日期 |
2000.11.30 |
申请人 |
SGS-THOMSON MICROELECTRONICS S.A |
发明人 |
GRIS YVON |
分类号 |
H01L29/73;H01L21/331;H01L29/08;H01L29/10;H01L29/165;H01L29/732;(IPC1-7):H01L21/331 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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