| 摘要 |
A method and apparatus for generating ultra-fast (picosecond-range) electrical sampling apertures and pulses, requiring only a single transition of a control signal, is disclosed. Implemented in a novel circuit architecture that is suited to fabrication as a low-cost monolithic integrated circuit, the method produces more stable, more reproducible, and more precisely shaped sampling apertures and pulses, with lower power usage and cost, than conventional techniques. The combination of speed and reproducibility enabled by the invention allows the integration of large numbers of virtually identical fast sampling apertures or pulse generators on a single IC, enabling single-shot capture of such a rapid sequence of samples that even a single cycle of a very fast, microwave frequency, electronic waveform may be precisely sampled at multiple points.
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