发明名称 METHOD FOR INSULATING COMPONENTS OF SEMICONDUCTOR DEVICES BY MEANS OF GROOVES
摘要 semiconductor engineering. SUBSTANCE: two types of oxide films are used for the purpose. Groove in semiconductor substrate is filled with multilayer film of two alternately applied oxide films having different stress characteristics. Composite oxide film filling the grooves is compacted. Then it is leveled off until upper surface of stencil layer is exposed. In this way groove filling layer is obtained. EFFECT: reduced stresses in vicinity of substrate insulation; enhanced degree of device integration. 17 cl, 7 dwg, 1 tbl
申请公布号 RU2187174(C2) 申请公布日期 2002.08.10
申请号 RU19970121905 申请日期 1997.12.30
申请人 SAMSUNG EHLEKTRONIKS KO., LTD. 发明人 PARK MUN-KHAN;KHONG SUG-KHUN;SIN JU-GJUN
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/76
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