发明名称 DEVICE AND METHOD FOR PLASMA PROCESSING
摘要 PROBLEM TO BE SOLVED: To secure the selection ratio of a mask or/and a base material and to perform a highly accurate surface processing. SOLUTION: Plasma generation and the control of a bias voltage to a material are respectively independently performed. Also, a high frequency voltage waveform for the bias voltage is leveled at an optional voltage, it is applied to a substrate electrode 115 on which the material 116 is mounted and ion energy distribution made incident on the material is controlled as desired.
申请公布号 JP2002222801(A) 申请公布日期 2002.08.09
申请号 JP20010286051 申请日期 2001.09.20
申请人 HITACHI LTD 发明人 KADOYA MASAHIRO;YASUI HISATERU;TAMURA HITOSHI;WATANABE SEIICHI
分类号 H05H1/46;B01J19/08;H01L21/205;H01L21/302;H01L21/3065 主分类号 H05H1/46
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