发明名称 |
DEVICE AND METHOD FOR PLASMA PROCESSING |
摘要 |
PROBLEM TO BE SOLVED: To secure the selection ratio of a mask or/and a base material and to perform a highly accurate surface processing. SOLUTION: Plasma generation and the control of a bias voltage to a material are respectively independently performed. Also, a high frequency voltage waveform for the bias voltage is leveled at an optional voltage, it is applied to a substrate electrode 115 on which the material 116 is mounted and ion energy distribution made incident on the material is controlled as desired. |
申请公布号 |
JP2002222801(A) |
申请公布日期 |
2002.08.09 |
申请号 |
JP20010286051 |
申请日期 |
2001.09.20 |
申请人 |
HITACHI LTD |
发明人 |
KADOYA MASAHIRO;YASUI HISATERU;TAMURA HITOSHI;WATANABE SEIICHI |
分类号 |
H05H1/46;B01J19/08;H01L21/205;H01L21/302;H01L21/3065 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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