发明名称 |
ALIGNER, SYSTEM AND METHOD FOR EXPOSURE |
摘要 |
PROBLEM TO BE SOLVED: To provide an aligner and a system for exposure enabling easier definition of an optimum operating parameter depending on production modes. SOLUTION: The system exposing a mask pattern on a substrate is provided with a memory 20 storing a number of operating parameters for exposure- related processing and a controller 14 switching the operating parameters based on the time slot for processing. It also is provided with a setting section containing a plurality of the aligners to set any operating parameter for plural memories in the lump. |
申请公布号 |
JP2002221800(A) |
申请公布日期 |
2002.08.09 |
申请号 |
JP20010018347 |
申请日期 |
2001.01.26 |
申请人 |
NIKON CORP |
发明人 |
AOKI ATSUYUKI |
分类号 |
G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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