发明名称 ALIGNER, SYSTEM AND METHOD FOR EXPOSURE
摘要 PROBLEM TO BE SOLVED: To provide an aligner and a system for exposure enabling easier definition of an optimum operating parameter depending on production modes. SOLUTION: The system exposing a mask pattern on a substrate is provided with a memory 20 storing a number of operating parameters for exposure- related processing and a controller 14 switching the operating parameters based on the time slot for processing. It also is provided with a setting section containing a plurality of the aligners to set any operating parameter for plural memories in the lump.
申请公布号 JP2002221800(A) 申请公布日期 2002.08.09
申请号 JP20010018347 申请日期 2001.01.26
申请人 NIKON CORP 发明人 AOKI ATSUYUKI
分类号 G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03F7/20 主分类号 G03F7/20
代理机构 代理人
主权项
地址