发明名称 EXPOSURE APPARATUS, METHOD OF MANUFACTURING DEVICE, AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an exposure apparatus that is high in overlay accuracy and to provide a method of manufacturing device using the exposure optical system of the exposure apparatus. SOLUTION: The exposure apparatus has the optical illumination system which illuminates a surface to be illuminated on which a prescribed pattern is formed, and a projection optical system which projects the pattern upon a workpiece to be treated and has a telecentric structure on the workpiece side. The optical illumination system has a function of adjusting the inclination of the principal ray of light. The exposure apparatus is constituted in such a way that the system projects the pattern upon the workpiece by only using the off-axis image forming area of the projection optical system and the optical axis of the optical illumination system is coaxial with the optical axis of the projection optical system.
申请公布号 JP2002222757(A) 申请公布日期 2002.08.09
申请号 JP20010019262 申请日期 2001.01.26
申请人 CANON INC 发明人 KONO MICHIO
分类号 G02B5/18;G02B19/00;G03F7/20;G03F7/22;H01L21/027;(IPC1-7):H01L21/027 主分类号 G02B5/18
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