发明名称 LIGHTING SYSTEM FOR INSPECTING FLAW
摘要 PROBLEM TO BE SOLVED: To provide a lighting system for inspecting flaws wherein a surface of a material to be inspected is evenly irradiated and flaws can be detected with a high detecting performance. SOLUTION: A plurality of optical fibers 26 comprises plural optical fiber bundles 22 which are aligned in a vertical direction with respect to an optical axis of the optical fibers 26. The system includes an optical fiber unit 21 connected so that the optical fiber bundles may line up along such alignment direction, and a light-gathering unit 40 connected so that a plurality of condenser lenses 42 comprising cylindrical lenses may form a line along the alignment direction of the optical fibers 26. The light-gathering unit 40 is placed at a light emitting side of the optical fiber unit 21 so that a connecting portion of the condenser lenses 42 may deviate in the alignment direction of the optical fibers 26 with respect to a connecting portion of the optical fiber bundles 22.
申请公布号 JP2002221491(A) 申请公布日期 2002.08.09
申请号 JP20010019723 申请日期 2001.01.29
申请人 NIPPON STEEL CORP;SUMITA OPTICAL GLASS INC 发明人 HASEGAWA NOBORU;KUNINAGA MANABU;KATORI HIDEO;INOMATA TOSHIICHI;TADENUMA KIEKO;HOSHI KIKUYOSHI
分类号 G01N21/84;G02B6/04;(IPC1-7):G01N21/84 主分类号 G01N21/84
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