| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a sensor using total reflection attenuation for detecting a refractive index of a specimen wherein generation of distortion of an image to examine distribution of the refractive index is prevented. SOLUTION: The sensor comprises a dielectric block 11, a thin film layer 13 which is formed on one face of the dielectric block 11 and brought into contact with the specimen 15, a light source 16 generating a light beam L, an incidence optical system 17 which emits the light beam L to the dielectric block 11 in a parallel light state so that total reflection conditions may be obtained and that the total reflection attenuation may be generated on an interface 11a between the dielectric block 11 and the thin film layer 13, and a light detecting means 23 which detects an image formed by the light beam L totally reflected from the interface 11a and detects distribution of the refractive index of the specimen 15 in a face along with the interface 112a, wherein a compensating optical system 21 comprising, for example, a dielectric block similar to the dielectric block 11 is provided, and the distortion of the image caused by the dielectric block 11 when an angle of incidenceθof the light beam L changes is compensated.</p> |
