发明名称 METHOD AND SYSTEM FOR INSPECTING THERMAL INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide an inspection system, etc., for thermal instrument which reduce the labor required for the inspection of a thermal instrument. SOLUTION: This inspection system is provided with a communication channel 1 connecting the installed site of a facility to a management base, an operating-state information collecting device 22 which is provided at the installed site and collects information on the operating state of the instrument, and a facility-side modem 3 which is interposed between the collecting device 22 and channel 1. The system is also provided with an information processor 4 which is provided at the management base, fetches the information on the operating state of the instrument through the communication channel 1, and executes the preparation of report data for recording inspections performed on the instrument and the downloading of the prepared report data to the installed site, a base-side modem 5 interposed between the processor 4 and channel 1, and an output device 6 which is provided at the installed site and outputs a report based on the downloaded report data. In addition, the system is also provided with a data storing device 7 which stores the report data whenever the data are prepared.
申请公布号 JP2002221301(A) 申请公布日期 2002.08.09
申请号 JP20010017365 申请日期 2001.01.25
申请人 MIURA CO LTD 发明人 SAKAMOTO TSUNEO;ISHIZAKI NOBUYUKI
分类号 F23N5/24;F22B37/02;F22B37/48;G05B23/02;G08B23/00;(IPC1-7):F22B37/02 主分类号 F23N5/24
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