| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC tester capable of shortening a test time. SOLUTION: This IC tester is provided by improving an IC tester for testing a test object. This device is characterized by having a signal generator for inputting a white noise into the test object, an analytical means for executing frequency analysis of an output of the test object, and calculating a spectrum to be tested, and a determination means for determining the quality based on the spectrum to be tested of the analytical means.
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