发明名称 Apparatus and method for testing semiconductor integrated circuit
摘要 There are provided a test apparatus and method for testing a semiconductor integrated circuit which enables improvements in the ease of operation and convenience of a BOST device and shortening of a test time. Numeric codes are assigned to tests. A test apparatus is equipped with memory and an analysis section. A test requirement table-in which hardware requirements required for conducting a test are set on a per-numeric-code basis-is stored in the memory. Test requirements corresponding to a numeric code are read from the memory, whereupon a test is performed. The analysis section analyzes a digital test output and sends the result of analysis to an external controller.
申请公布号 US2002108080(A1) 申请公布日期 2002.08.08
申请号 US20010927404 申请日期 2001.08.13
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MORI HISAYA;YAMADA SHINJI;FUNAKURA TERUHIKO
分类号 G01R31/316;G01R31/28;G01R31/3183;G01R31/3185;G01R31/319;H03M1/10;H03M1/66;(IPC1-7):G01R31/28;G06F11/00 主分类号 G01R31/316
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