发明名称 |
Resin sealed electronic device |
摘要 |
Durability and lifetime of a resin sealed electronic device is improved by reducing thermal stresses acting on the power element and the parts mounting on the board. A power element of which the protective film on the power element is coated with a polyimide group resin at manufacturing the element is used, and a metallic heat sink of which the reverse side surface (portion of mounting on a board) is not plated is used. Further, a linear expansion coefficient of the molding resin is within a range of 3x10-6/° C. to 17x10-6/° C. The durability and the lifetime of the resin sealed electronic device is improved, because the thermal stresses are reduced by balancing linear expansion coefficients of the parts.
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申请公布号 |
US2002104519(A1) |
申请公布日期 |
2002.08.08 |
申请号 |
US20020040463 |
申请日期 |
2002.01.09 |
申请人 |
HITACHI, LTD |
发明人 |
HIRAKAWA SATOSHI;KAMINAGA TOSHIAKI;KOBAYASHI RYOICHI;SUGIURA NOBORU |
分类号 |
H01L23/373;F02P3/02;F02P15/00;H01L23/31;H01L23/433;H01L25/07;H01L25/18;H05K3/28;H05K5/06;(IPC1-7):F02P1/00 |
主分类号 |
H01L23/373 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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