发明名称 Resin sealed electronic device
摘要 Durability and lifetime of a resin sealed electronic device is improved by reducing thermal stresses acting on the power element and the parts mounting on the board. A power element of which the protective film on the power element is coated with a polyimide group resin at manufacturing the element is used, and a metallic heat sink of which the reverse side surface (portion of mounting on a board) is not plated is used. Further, a linear expansion coefficient of the molding resin is within a range of 3x10-6/° C. to 17x10-6/° C. The durability and the lifetime of the resin sealed electronic device is improved, because the thermal stresses are reduced by balancing linear expansion coefficients of the parts.
申请公布号 US2002104519(A1) 申请公布日期 2002.08.08
申请号 US20020040463 申请日期 2002.01.09
申请人 HITACHI, LTD 发明人 HIRAKAWA SATOSHI;KAMINAGA TOSHIAKI;KOBAYASHI RYOICHI;SUGIURA NOBORU
分类号 H01L23/373;F02P3/02;F02P15/00;H01L23/31;H01L23/433;H01L25/07;H01L25/18;H05K3/28;H05K5/06;(IPC1-7):F02P1/00 主分类号 H01L23/373
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