发明名称 Verfahren zur Herstellung eines Substrats für die Fabrikation von Halbleitervorrichtungen aus Silizium
摘要 One or a plurality of silicon growth layers (12) are formed on both sides of a silicon base substrate wafer (11) and the product is then divided, with the dividing plane (A) in said silicon base substrate wafer (11) parallel to the main surface, into two pieces to obtain two substrates used for manufacturing silicon semiconductor elements. Said dividing-in-half process is a process in which said silicon base substrate wafer portion is cut along a plane parallel to the main surface, or a process which includes said cutting process followed by a process of treating the cut-surface. Said process which cuts the silicon base substrate wafer portion is a process in which the wafers are cut one by one, or cut after a plurality of them are laminated. <IMAGE>
申请公布号 DE69522976(T2) 申请公布日期 2002.08.08
申请号 DE1995622976T 申请日期 1995.03.02
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 ITO, TATSUO
分类号 C23C16/44;H01L21/02;H01L21/20;H01L21/205;H01L21/304;H01L21/336;H01L21/762;H01L29/78;(IPC1-7):H01L21/20;B28D1/00 主分类号 C23C16/44
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