发明名称 |
Method for analyzing reaction test sample using test sample chip |
摘要 |
The present provides a method for analyzing a reaction test sample using test sample chips, by which a number of test sample chips can be prepared with fixing test samples of a very slight amount being disposed on each of the test sample chips of substrates at a high density, and detection of reaction test samples can be efficiently carried out with a single operation by using the corresponding test sample chips.
|
申请公布号 |
US2002106804(A1) |
申请公布日期 |
2002.08.08 |
申请号 |
US20010863981 |
申请日期 |
2001.05.23 |
申请人 |
NIPPON LASER & ELECTRONICS LAB |
发明人 |
TANAKA KOJI |
分类号 |
G01N1/00;G01N35/00;G01N35/10;(IPC1-7):B01L3/02 |
主分类号 |
G01N1/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|