Electronic test circuit for memory component has command evaluation circuit controlling multiplexer to apply first or second address to address bus depending on command

摘要

The circuit has an address selection circuit (9) connected to first and second address memories (10,11) for storing first and second addresses, a multiplexer (15) connected to the address memories and to an address bus (3) and a command evaluation circuit (13) connected to the multiplexer and that controls it to apply the first or second address to the address bus depending on a command concerning the memory component. Independent claims are also included for the following: a method of generating data and testing a memory component.