发明名称 Method for manufacturing a polysilicon type thin film transistor
摘要 A method for manufacturing a polysilicon type thin film transistor comprises the steps of forming a polysilicon layer on a substrate, forming a gate insulating layer on the polysilicon layer, forming a gate layer on the gate insulating layer, forming a gate pattern by patterning, implanting impurities in the substrate over which the gate pattern is formed, forming a cover layer over the substrate in which impurities are implanted, and thermally annealing the substrate over which the cover layer is formed. In the invention, the thermal annealing carried out instead of a costly laser annealing after the impurity implantation.
申请公布号 US2002106586(A1) 申请公布日期 2002.08.08
申请号 US20010906680 申请日期 2001.07.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOU CHUN-GI
分类号 H01L21/28;G02F1/136;H01L21/265;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):G03F7/00 主分类号 H01L21/28
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