发明名称 POST-EPITAXIAL THERMAL OXIDATION FOR REDUCING MICROSTEPS ON POLISHED SEMICONDUCTOR WAFERSOST EPITAXIAL THERMAL OXIDATION
摘要 Disclosed is a system and method for handling post epitaxial thermal oxidation. The method produces semiconductor wafers by performing the steps of forming a wafer substrate, depositing an epilayer on the substrate, oxidizing a top portion of the epilayer, and removing the oxidized top portion. As a result, the wafer's surface is very smooth, with little or no micro-steps thereon.
申请公布号 US2002106872(A1) 申请公布日期 2002.08.08
申请号 US20020114899 申请日期 2002.04.02
申请人 MOS EPI, INC. 发明人 KENNEY DANNY;LINDBERG KEITH
分类号 H01L21/00;H01L21/20;H01L21/321;(IPC1-7):H01L21/20 主分类号 H01L21/00
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