发明名称 |
HEAT TREATMENT APPARATUS AND WAFER SUPPORT RING |
摘要 |
A heat treatment apparatus rapidly and uniformly heats an entire surface of a silicon wafer so as to apply a heat treatment to the silicon wafer. A wafer support ring supports the silicon wafer during the heat treatment. The wafer support ring is formed of silicon carbide having a vacancy rate of 5% to 20% on a density basis. Alternatively, the wafer support ring may be formed of a ceramics matrix composite material, or may be formed of silicon carbide containing an impurity added by a concentration ratio of 10<-7> to 10<-4>. |
申请公布号 |
WO02061808(A2) |
申请公布日期 |
2002.08.08 |
申请号 |
WO2002JP00657 |
申请日期 |
2002.01.29 |
申请人 |
TOKYO ELECTRON LIMITED;SHIMIZU, MASAHIRO;SAKUMA, TAKESHI;SHIGEOKA, TAKASHI |
发明人 |
SHIMIZU, MASAHIRO;SAKUMA, TAKESHI;SHIGEOKA, TAKASHI |
分类号 |
H01L21/683;H01L21/26;H01L21/687 |
主分类号 |
H01L21/683 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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