发明名称 HEAT TREATMENT APPARATUS AND WAFER SUPPORT RING
摘要 A heat treatment apparatus rapidly and uniformly heats an entire surface of a silicon wafer so as to apply a heat treatment to the silicon wafer. A wafer support ring supports the silicon wafer during the heat treatment. The wafer support ring is formed of silicon carbide having a vacancy rate of 5% to 20% on a density basis. Alternatively, the wafer support ring may be formed of a ceramics matrix composite material, or may be formed of silicon carbide containing an impurity added by a concentration ratio of 10<-7> to 10<-4>.
申请公布号 WO02061808(A2) 申请公布日期 2002.08.08
申请号 WO2002JP00657 申请日期 2002.01.29
申请人 TOKYO ELECTRON LIMITED;SHIMIZU, MASAHIRO;SAKUMA, TAKESHI;SHIGEOKA, TAKASHI 发明人 SHIMIZU, MASAHIRO;SAKUMA, TAKESHI;SHIGEOKA, TAKASHI
分类号 H01L21/683;H01L21/26;H01L21/687 主分类号 H01L21/683
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