发明名称 Conditioning wheel for conditioning a semiconductor wafer polishing pad and method of manufacture thereof
摘要 The present invention provides an improved conditioning wheel for conditioning polishing pads used to polish semiconductor wafers. In one embodiment, the conditioning wheel includes a planar body having a metal surface located thereon. The metal surface has abrasive particles embedded therein and a retainer coating deposited over the metal surface and the abrasive particles. The retainer coating inhibits the abrasive particles from dislodging during a conditioning process.
申请公布号 US2002106979(A1) 申请公布日期 2002.08.08
申请号 US20010778986 申请日期 2001.02.07
申请人 NANDA ARUN K.;RODRIGUEZ JOSE OMAR;SCHULTZ LAURENCE D.;STOREY CHARLES A. 发明人 NANDA ARUN K.;RODRIGUEZ JOSE OMAR;SCHULTZ LAURENCE D.;STOREY CHARLES A.
分类号 B24B37/04;B24B53/12;B24D3/06;B24D3/34;(IPC1-7):B24B1/00 主分类号 B24B37/04
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