NICKEL ALLOY PROBE CARD FRAME LAMINATE

摘要

A probe head assembly (66) for use in a vertical pin probing device of the type used to electrically test integrated circuit devices has a metallic spacer (74, 76) portion formed from a plurality of laminated metallic layers (74a-74e, 76a-76e). The laminated metallic layers (74a-74e, 76a-76e) are formed from a low coefficient of thermal expansion metal, such as Invar, a 36 % nickel-64 % iron alloy. By orienting the metallic grains of the laminated metal layers (74a-74e, 76a-76e) to be off-set from the orientation of metallic grains of adjacent foil layers (74a-74e, 76a-76e), increased strength and flatness is achieved.