发明名称 SILICON GERMANIUM BIPOLAR TRANSISTOR
摘要 A SiGe bipolar transistor containing substantially no dislocation defects present between the emitter and collector region and a method of forming the same are provided. The SiGe bipolar transistor includes a collector region (52) of a first conductivity type; a SiGe base region (54) formed on a portion of said collector region (52); and an emitter region (56) of said first conductivity type formed over a portion of said base region (54), wherein said collector region (52) and said base region (54) include carbon continuously therein. The SiGe base region (54) is further doped with boron.
申请公布号 WO02061820(A1) 申请公布日期 2002.08.08
申请号 WO2001GB05149 申请日期 2001.11.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM UNITED KINGDOM LIMITED 发明人 CHU, JACK, OON;COOLBAUGH, DOUGLAS, DUANE;DUNN, JAMES, STUART;GREENBERG, DAVID;HARAME, DAVID;JAGANNATHAN, BASANTH;JOHNSON, ROBB, ALLEN;LANZEROTTI, LOUIS;SCHONENBERG, KATHRYN, TURNER;WUTHRICH, RYAN, WAYNE
分类号 H01L21/331;H01L29/737;(IPC1-7):H01L21/331 主分类号 H01L21/331
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