发明名称 Semiconductor device and manufacturing method of the same
摘要 <p>A variable capacitor includes an N&lt;+&gt; layer including a variable capacitance region, a P&lt;+&gt; layer epitaxially grown on the N&lt;+&gt; layer and formed from a SiGe film and a Si film, and a P-type electrode. An NPN-HBT (Hetero-junction Bipolar Transistor) includes a collector diffusion layer formed simultaneously with the N&lt;+&gt; layer of the variable capacitor, a collector layer, and a Si/SiGe layer epitaxially grown simultaneously with the P&lt;+&gt; layer of the variable capacitor. Since a depletion layer formed in a PN junction of the variable capacitor can extend entirely across the N&lt;+&gt; layer, reduction in variation range of the capacitance can be suppressed. &lt;IMAGE&gt;</p>
申请公布号 EP1229584(A2) 申请公布日期 2002.08.07
申请号 EP20020002649 申请日期 2002.02.05
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 OHNISHI, TERUHITO;TAKAGI, TAKESHI;ASAI, AKIRA;FUJII, TAIZO;SUGIURA, MITSUO;MINAMI, YOSHIHISA
分类号 H01L27/06;H01L27/08;H01L29/93;(IPC1-7):H01L27/08;H01L21/824;H01L21/822;H01L29/737 主分类号 H01L27/06
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