发明名称 Method and apparatus for end point detection in a chemical mechanical polishing process using two laser beams
摘要 A method and an apparatus for determining end point in a chemical mechanical polishing process by utilizing two separate laser beams are provided. When two separate laser beams of different wavelengths are utilized, the difference in the wavelengths is at least about 50 nm. For instance, one wavelength may be about 633 nm, while the other wavelength may be about 700~950 nm. When two laser beams of different incident angles are utilized, the difference in the angles may be at least 2°, and preferably at least 5°.
申请公布号 US6429130(B1) 申请公布日期 2002.08.06
申请号 US19990451231 申请日期 1999.11.29
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 CHUANG JUI-PING
分类号 B24B37/04;B24B49/12;H01L21/302;(IPC1-7):H01L21/302 主分类号 B24B37/04
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