发明名称 Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems
摘要 A machine and method for bonding puncture-type conductive contact members of an interconnect to the bond pads of a bare semiconductor die includes the use of one or two ultrasonic vibrators mounted to vibrate one or both of the die and interconnect. A short axial linear burst of ultrasonic energy enables the contact members to pierce hard oxide layers on the surfaces of the bond pads at a much lower compressive force and rapidly achieve full penetration depth.
申请公布号 US6427899(B2) 申请公布日期 2002.08.06
申请号 US20010921622 申请日期 2001.08.03
申请人 MICRON TECHNOLOGY, INC. 发明人 HEMBREE DAVID R.;HESS MICHAEL E.;JACOBSON JOHN O.;FARNWORTH WARREN M.;WOOD ALAN G.
分类号 B23K20/10;(IPC1-7):B23K20/10;B23K31/02 主分类号 B23K20/10
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