发明名称 Single-substrate-processing CVD method of forming film containing metal element
摘要 A single-substrate-processing CVD apparatus is used for forming a BST thin film on a semiconductor wafer while supplying a first process gas containing a mixture of Ba(thd)2 and Sr(thd)2, and a second process gas containing Ti(O-iPr)(thd)2 or Ti(thd)2. Precursors of Ba and Sr have lower activation energies and higher resistivities than precursors of Ti. The first and second process gases are supplied from a shower head which has a group of first spouting holes for spouting the first process gas and a group of second spouting holes for spouting the second process gas. The group of the second spouting holes are designed to have diameters gradually decreasing in radial directions outward from the center of a shower region, such that the second process gas is supplied at a spouting rate gradually decreasing in radial directions outward from the center.
申请公布号 US6428850(B1) 申请公布日期 2002.08.06
申请号 US20000613694 申请日期 2000.07.10
申请人 TOKYO ELECTRON LIMITED 发明人 SHINRIKI HIROSHI;LIU YIJUN;SUGIURA MASAHITO
分类号 C23C16/40;C23C16/44;C23C16/455;C23C16/458;(IPC1-7):C23C16/06;C23C16/18 主分类号 C23C16/40
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