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发明名称
ANALYZING METHOD FOR PROXIMITY EFFECT OF ELECTRON BEAM EXPOSURE
摘要
申请公布号
JPH01232720(A)
申请公布日期
1989.09.18
申请号
JP19880059721
申请日期
1988.03.14
申请人
MATSUSHITA ELECTRIC IND CO LTD
发明人
IKEDA KAZUJI
分类号
H01L21/027;H01L21/30
主分类号
H01L21/027
代理机构
代理人
主权项
地址
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