发明名称 Fuse circuit using anti-fuse and method for searching for failed address in semiconductor memory
摘要 A fuse circuit comprises first and second electric fuses, a differential amplifier and a switch circuit. The first and second electric fuses have their respective current characteristics changed when a voltage of a predetermined level or more is applied thereto. The differential amplifier receives two voltage signals based on the current characteristics of the first and second electric fuses, outputs a predetermined voltage on the basis of a difference in voltage between the two voltage signals, and amplifies the predetermined voltage. The memory circuit stores an output from the differential amplifier. The switch circuit connects and disconnects the differential amplifier to and from the memory circuit.
申请公布号 US6430101(B1) 申请公布日期 2002.08.06
申请号 US20010931024 申请日期 2001.08.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TODA HARUKI
分类号 G11C11/401;G11C17/16;G11C17/18;G11C29/04;G11C29/44;H01L21/822;H01L27/04;(IPC1-7):G11C7/00 主分类号 G11C11/401
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