发明名称 NON-VOLATILE SEMICONDUCTOR MEMORY AND ITS ERASING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To set an erasure pulse applying time so that dispersion of threshold voltage is made small without deteriorating erasure speed. SOLUTION: Voltage Vrpin to which voltage Vpp (12 V) for an external terminal 26 is dropped by a resistance element 28 of 3500Ωis supplied to a regulator circuit 27 as a voltage value of an erasure pulse applied to a common source line 21, and voltage Vpll stabilized to 5 V is obtained. A level detecting circuit 22 starts from 5 V at the time of start of erasing, and finish of applying an erasure pulse of a first time is discriminated by a compared result of input voltage Vrpin for the regulator circuit 27 having large voltage amplitude of approximately 6 V or more and reference voltage Vref of 11 V. Thereby, dispersion of threshold voltage of a memory cell after finish of applying an erasure pulse of the first time can be reduced. Therefore, a resistance element for enlarging variation of source line voltage is not required, erasure speed never be deteriorated.</p>
申请公布号 JP2002216489(A) 申请公布日期 2002.08.02
申请号 JP20010013029 申请日期 2001.01.22
申请人 SHARP CORP 发明人 HIRANO YASUAKI
分类号 G11C16/06;G11C16/02;G11C16/04;G11C16/16;G11C16/30;G11C16/34;H01L31/0336;(IPC1-7):G11C16/06 主分类号 G11C16/06
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