发明名称 METHOD AND APPARATUS FOR RECOVERING WAFER FOR WAFER POLISHING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an easy wafer recovery method for a wafer polishing apparatus after a wafer polishing is completed, and the apparatus. SOLUTION: After a wafer polishing is completed, the wafer is protruded a predetermined length from the peripheral edge of a polishing pad 20 by sliding the wafer W along the polishing pad 20. Then a fluid is emitted into the clearance between the protruded wafer W and the polishing pad 20 from a wafer separation nozzle 18. The emitted liquid gets into the clearance between the wafer W and the polishing pad 20, which uplifts the wafer from the polishing pad 20 to separate the wafer. Consequently, the wafer can be efficiently withdrawn from the polishing pad 20 without adding stiff force to the wafer.
申请公布号 JP2002217147(A) 申请公布日期 2002.08.02
申请号 JP20010007576 申请日期 2001.01.16
申请人 TOKYO SEIMITSU CO LTD 发明人 NUMAMOTO MINORU;HONMA SHIGEYUKI
分类号 B24B37/04;H01L21/304 主分类号 B24B37/04
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