发明名称 DIODE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a diode that has a small amount for parasitic capacity, even though current-voltage characteristics do not vary, and to provide a method of manufacturing the diode. SOLUTION: A P+ impurity layer 14, facing the surface of an N+ impurity layer 13, is provided between the surface of the N+ impurity layer 13 and an N- impurity layer 21 in the N+ impurity layer 13, thus thickening the depletion layer on the bottom surface of the P+ impurity layer 14 with reduced junction capacity, as compared with the case where the N+ impurity layer 13 is jointed the bottom surface of the P+ impurity layer 14.
申请公布号 JP2002217423(A) 申请公布日期 2002.08.02
申请号 JP20010010334 申请日期 2001.01.18
申请人 SONY CORP 发明人 KOBAYASHI JUNICHIRO
分类号 H01L27/04;H01L21/329;H01L21/822;H01L27/06;H01L29/861;(IPC1-7):H01L29/861 主分类号 H01L27/04
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