发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To efficiently perform processes to a semiconductor substrate, such as dry etching, and cleaning for removing foreign materials after the processes. SOLUTION: The method for fabricating a semiconductor device comprises a step removing foreign materials using the electric action of plasma which is generated by a plasma generating means 9 jointly with a physical action by the friction strain of a high speed gas flow which is generated at a pat type structure 5 placed close to the face of wafer 2. |
申请公布号 |
JP2002217169(A) |
申请公布日期 |
2002.08.02 |
申请号 |
JP20010007158 |
申请日期 |
2001.01.16 |
申请人 |
HITACHI LTD |
发明人 |
YOKOGAWA KATANOBU;MOMOI YOSHINORI;TSUJIMOTO KAZUNORI;TAJI SHINICHI |
分类号 |
H05H1/46;B01J19/00;B01J19/08;H01L21/00;H01L21/302;H01L21/304;H01L21/306;H01L21/3065;H01L21/461 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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