发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To efficiently perform processes to a semiconductor substrate, such as dry etching, and cleaning for removing foreign materials after the processes. SOLUTION: The method for fabricating a semiconductor device comprises a step removing foreign materials using the electric action of plasma which is generated by a plasma generating means 9 jointly with a physical action by the friction strain of a high speed gas flow which is generated at a pat type structure 5 placed close to the face of wafer 2.
申请公布号 JP2002217169(A) 申请公布日期 2002.08.02
申请号 JP20010007158 申请日期 2001.01.16
申请人 HITACHI LTD 发明人 YOKOGAWA KATANOBU;MOMOI YOSHINORI;TSUJIMOTO KAZUNORI;TAJI SHINICHI
分类号 H05H1/46;B01J19/00;B01J19/08;H01L21/00;H01L21/302;H01L21/304;H01L21/306;H01L21/3065;H01L21/461 主分类号 H05H1/46
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