发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE MANUFACTURED BY USING THE SAME
摘要 PROBLEM TO BE SOLVED: To solve the problem where manufacturing cost is high and yield is low. SOLUTION: A second metal film 7 is deposited. A dielectric film is deposited. By patterning it by photoetching, a residual dielectric film 8 is formed which is left in a region for forming an MIM capacitor 1. A third metal film 9 is deposited. After that, the third metal film 9, the residual dielectric film 8 and the second metal film 7 are patterned by photoetching wherein the same resist pattern is used as a mask. As a result, a second layer wiring 10, an upper electrode 11, a dielectric layer 12, and a lower electrode 13 of the MIM capacitor 1 are formed.
申请公布号 JP2002217373(A) 申请公布日期 2002.08.02
申请号 JP20010009322 申请日期 2001.01.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 HIYAKUNOU HIROYUKI;OKADA KATSUYA
分类号 H01L21/3213;H01L21/768;H01L21/822;H01L23/522;H01L27/04;(IPC1-7):H01L27/04;H01L21/321 主分类号 H01L21/3213
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