发明名称 CELL AND SEMICONDUCTOR DEVICE WITH IT
摘要 PROBLEM TO BE SOLVED: To provide a cell capable of preventing the damage of a gate oxide film by connecting a gate to a wring in an uppermost layer, and a semiconductor device. SOLUTION: The cell 14 has a silicon substrate 1, an oxide film 2, insulating films 3-6, the gate oxide film 7, an input gate 8, wirings 9-11 and cell input terminals 12 and 13. Charges stored in the wiring 11 connected to the input gate 8 is preventing from being discharged only from the input gate 8 by connecting the input gate 8 to the wiring 11 in the uppermost layer among the wirings 9 to 11 in three layers, and the damage of the gate oxide film 7 can be prevented.
申请公布号 JP2002217201(A) 申请公布日期 2002.08.02
申请号 JP20010013119 申请日期 2001.01.22
申请人 SEIKO EPSON CORP 发明人 MAKABE TAKESHI
分类号 H01L21/3205;H01L21/822;H01L27/04;H01L29/78;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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