发明名称 MANUFACTURING METHOD FOR SILICON OXIDE FILM ELECTRET, SILICON OXIDE FILM ELECTRET OBTAINED BY THE MANUFACTURING METHOD, AND ELECTRET CAPACITOR MICROPHONE PROVIDED WITH THE SILICON OXIDE FILM ELECTRET
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method for a silicon oxide film electret by which a sufficiently high deposition rate is obtained with less contained materials such as moisture and hydrogen, the silicon oxide film electret and an ECM(Electret Capacitor Microphone) provided with the silicon oxide film electret. SOLUTION: The manufacturing method for the silicon oxide film electret includes a process where oxygen is introduced in a vacuum processing chamber 2 in which a substrate 100 is placed, a process where the introduced oxygen is ionized by plasma treatment, a process where electrons collide with a silicon single body or a solid silicon compound whose major components are silicon and oxygen to generate gaseous silicon, a process where the gaseous silicon is ionized by plasma treatment, a process where a silicon oxide film is deposited on the substrate 100 on the basis of the reaction between the ionized oxygen and the silicon, and a process where the silicon oxide film is polarized.
申请公布号 JP2002218594(A) 申请公布日期 2002.08.02
申请号 JP20010014332 申请日期 2001.01.23
申请人 HOSIDEN CORP;ENYA SYSTEMS LTD 发明人 YASUDA MAMORU;SUGIMORI YASUO;SANO TETSUO;SERITA ISAO
分类号 H04R19/01;H01G7/02;H04R31/00;(IPC1-7):H04R19/01 主分类号 H04R19/01
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