发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that eliminates the occurrence of an erroneous comparison result just after power-down control in programmable impedance control circuit so as to attain the power-down control by a stop clock. SOLUTION: In the semiconductor device that has a connection terminal to which an external resistor is connected, an output buffer having transistor(TR) group for external drive where TRs with different widths are connected in parallel, an output impedance control means that automatically adjusts the impedance of the output buffer depending on the resistance of the external resistor, and a power-down function, the output impedance control means has a dummy buffer similarly configured to the output buffer and a comparison means that compares a 1st current flowing through the connection terminal with a 2nd current flowing through the dummy buffer and controls the comparison means to be inoperative for a recovery period of the dummy buffer after the power-down function is released.
申请公布号 JP2002217706(A) 申请公布日期 2002.08.02
申请号 JP20010007681 申请日期 2001.01.16
申请人 TOSHIBA CORP 发明人 HATADA HIROSHI;OTSUKA NOBUAKI
分类号 G11C11/413;G11C11/407;G11C11/409;G11C11/417;H03K19/0175;(IPC1-7):H03K19/017 主分类号 G11C11/413
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