发明名称 System for frequency adjustment of piezoelectric resonators by dual-track ion etching
摘要 System for frequency adjustment of piezoelectric resonators by ion etching in vacuum, based on arranging the resonators in rows and columns on a tray that can be moved to simultaneously expose two rows of resonators to the two straight-track portions of an ion gun having a race-track-shaped beam pattern whose straight tracks are spaced at an integer multiple of the inter-row spacing d. As the tray is moved in steps of d, two rows can be etched simultaneously, and each row can be sequentially exposed to a "pre-etch" and "final-etch" stage, with time between the two stages for the resonators to cool down after the "pre-etch" stage.
申请公布号 US2002100744(A1) 申请公布日期 2002.08.01
申请号 US20010774234 申请日期 2001.01.31
申请人 LEITZ JOHN R. 发明人 LEITZ JOHN R.
分类号 H03H3/04;(IPC1-7):B44C1/22;C03C25/68;C23F1/00 主分类号 H03H3/04
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