| 摘要 |
In measuring the resistance value of an output buffer, a supply voltage is supplied to a first P-channel transistor in its source through an ammeter provided within an IC tester, a ground potential is supplied from the IC tester to a first N-channel transistor in its source, and a voltmeter provided within the IC tester is connected to a first external output terminal. A test control signal is then brought to a high level. Further, a test signal of a plurality of bits, which brings only a first test control signal to a high level while brining the remaining 2nd to nth test control signals to a low level, is input into a decoder. As a result, the first P-channel transistor and the first N-channel transistor are brought to an ON state, while 2nd to nth external output terminals are brought to a high-impedance state. By virtue of the above construction, a semiconductor integrated circuit and a method for testing the same can be realized which can highly reliably measure the resistance value of a high-drive output buffer without undergoing the influence of contact resistance caused between the semiconductor integrated circuit and the IC tester and preferably can suppress the deterioration of the circuit. |
