发明名称 |
METHOD AND CIRCUIT FOR DRIVING WORD LINE IN SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A method and a circuit for driving a word line in a semiconductor memory device are provided, which performs a word line boosting simply without lowering the whole speed of a memory operation by improving a boosting operation, and removes a prior ring oscillator to recover a lowered boosting level, and maintains a boosting level of the word line stably without adopting the ring oscillator, and also reduces the load of a layout and power consumption. CONSTITUTION: The word line driving circuit includes an ATD(Address Transfer Detect) pulse generation part(10), a pulse control part(12), a predecoder(4), a booster(14) and a main decoder(6). The ATD pulse generation part generates an ATD pulse signal by sensing a transition of an address signal being output through an address buffer. The pulse control part generates a pulse word line enable signal(PWL) related to a word line driving in response to a rising edge of the ATD pulse signal, and generates a boosting enable signal(Pboost) in response to a falling edge of the ATD pulse signal. The predecoder generates a signal by predecoding the applied address signal in response to the pulse word line enable signal. The booster generates a boosted voltage(Boosted PWR) having a higher level than a power supply voltage in response to the boosting enable signal. And the main decoder receives the boosted voltage as a driving power supply voltage and makes the word line selected by decoding the predecoding signal to be boosted as a higher level than the power supply voltage.
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申请公布号 |
KR20020063018(A) |
申请公布日期 |
2002.08.01 |
申请号 |
KR20010003681 |
申请日期 |
2001.01.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, U YEONG;KWAK, CHUNG GEUN;SON, JONG PIL |
分类号 |
G11C8/08;(IPC1-7):G11C8/08 |
主分类号 |
G11C8/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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