发明名称 FABRICATION OF HIGH RESISTIVITY STRUCTURES USING FOCUSED ION BEAMS
摘要 <p>The present invention provides a method for creating microscopic high resistivity structures on a target by directing a focused ion beam (18) toward an impact point on the target and directing a precursor gas toward the impact point, the ion beam causing the precursor gas to decompose and thereby deposit a structure exhibiting high resistivity onto the target (22). The precursor gas preferably comprises a first compound that would form a conductive layer and a second compound that would form an insulating layer if each of the first and second compounds were applied alone in the presence of the ion beam.</p>
申请公布号 WO2002059926(A2) 申请公布日期 2002.08.01
申请号 US2002002075 申请日期 2002.01.25
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