发明名称 NUMERICAL APERTURE INCREASING LENS (NAIL) TECHNIQUES FOR HIGH-RESOLUTION SUB-SURFACE IMAGING
摘要 A viewing enhancement lens (18 - NAIL) which functions to increase the numerical aperture or light gathering or focusing power of viewing optics such as a microscope (26) used to view structure within a substrate such as a semiconductor wafer or chip or of imaging optics such as media recorders. The result is to increase the resolution of the system by a factor of between n, and n<2>, where n is the index of refraction of the lens substrate.
申请公布号 WO0079313(A9) 申请公布日期 2002.08.01
申请号 WO2000US40253 申请日期 2000.06.20
申请人 TRUSTEES OF BOSTON UNIVERSITY;IPPOLITO, STEPHEN, B.;UNLU, M., SELIM;GOLDBERG, BENNETT, B. 发明人 IPPOLITO, STEPHEN, B.;UNLU, M., SELIM;GOLDBERG, BENNETT, B.
分类号 G02B21/02;G02B21/00;G02B21/33;G02B27/58;G11B7/135;(IPC1-7):G02B3/00;G11B7/00 主分类号 G02B21/02
代理机构 代理人
主权项
地址