发明名称 |
Semiconductor device and its fabrication method |
摘要 |
An interlayer dielectric film that surrounds via holes for connecting wirings of a second wiring layer and the wirings of a third wiring layer is constituted of a dielectric material having a relatively smaller Young's modulus compared with the Young's modulus of a dielectric material constituting a dielectric film that surrounds wiring grooves in dual damascene wirings, which can improve the heat resistance and electromigration resistance of the dual damascene wirings.
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申请公布号 |
US2002100984(A1) |
申请公布日期 |
2002.08.01 |
申请号 |
US20010987914 |
申请日期 |
2001.11.16 |
申请人 |
HITACHI, LTD. |
发明人 |
OSHIMA TAKAYUKI;MIYAZAKI HIROSHI;AOKI HIDEO;OHMORI KAZUTOSHI |
分类号 |
C23C16/42;H01L21/316;H01L21/3205;H01L21/768;H01L21/8238;H01L23/522;H01L23/532;H01L27/092;(IPC1-7):H01L21/476;H01L23/48 |
主分类号 |
C23C16/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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