发明名称 Semiconductor device and its fabrication method
摘要 An interlayer dielectric film that surrounds via holes for connecting wirings of a second wiring layer and the wirings of a third wiring layer is constituted of a dielectric material having a relatively smaller Young's modulus compared with the Young's modulus of a dielectric material constituting a dielectric film that surrounds wiring grooves in dual damascene wirings, which can improve the heat resistance and electromigration resistance of the dual damascene wirings.
申请公布号 US2002100984(A1) 申请公布日期 2002.08.01
申请号 US20010987914 申请日期 2001.11.16
申请人 HITACHI, LTD. 发明人 OSHIMA TAKAYUKI;MIYAZAKI HIROSHI;AOKI HIDEO;OHMORI KAZUTOSHI
分类号 C23C16/42;H01L21/316;H01L21/3205;H01L21/768;H01L21/8238;H01L23/522;H01L23/532;H01L27/092;(IPC1-7):H01L21/476;H01L23/48 主分类号 C23C16/42
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