发明名称 Selective chemical-mechanical polishing properties of a cross-linked polymer and specific applications therefor
摘要 The present invention is directed, in general, to a method of polishing a surface on substrates, such as semiconductor wafers and, more specifically, to a polishing pad suitable for this purpose. The polishing pad comprises a polishing body that includes a cross-linked polymer material, and may be incorporated into a polishing apparatus. Polishing includes positioning the substrate containing at least one layer against the polishing body and polishing the layer.
申请公布号 US2002102924(A1) 申请公布日期 2002.08.01
申请号 US20010000101 申请日期 2001.10.24
申请人 OBENG YAW S.;YOKLEY EDWARD M. 发明人 OBENG YAW S.;YOKLEY EDWARD M.
分类号 B24B37/04;B24B49/16;B24D3/26;B24D13/14;B24D18/00;B29C59/14;(IPC1-7):B24B1/00 主分类号 B24B37/04
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