发明名称 Method for producing dual damascene interconnections and structure produced thereby
摘要 A method (and structure) of forming an interconnect on a semiconductor substrate, includes forming a relatively narrow first structure in a dielectric formed on a semiconductor substrate, forming a relatively wider second structure in the dielectric formed on the semiconductor substrate, forming a liner in the first and second structures such that the first structure is substantially filled and the second structure is substantially unfilled, and forming a metallization over the liner to completely fill the second structure.
申请公布号 US2002100983(A1) 申请公布日期 2002.08.01
申请号 US20010772920 申请日期 2001.01.31
申请人 CLEVENGER LAWRENCE A.;NESBIT LARRY A. 发明人 CLEVENGER LAWRENCE A.;NESBIT LARRY A.
分类号 H01L23/522;H01L21/3205;H01L21/768;H01L23/52;H01L23/532;(IPC1-7):H01L23/48;H01L21/44;H01L21/476 主分类号 H01L23/522
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