| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a light sampling device capable of sampling in relatively high frequency region. SOLUTION: The light sampling device 10 includes an optical fiber (light source of light to be measured) 13 for introducing the light to be measured, the light source 12 of the sampling light, photodetector 16, and sampling materials 11. The light to be measured from the optical fiber 13 is absorbed by a semiconductor layer 20 of the sampling materials 11 when no irradiation with pulsed sampling light is given. However, it transmits through the semiconductor layer 20 of the sampling materials 11 and reaches the photodetedor 16, reflected by a high reflection layer 19, when irradiation with the sampling light is given. The semiconductor layer 20 is formed with a bulk material or has a structure with inclined composition or a multi-layered quantum well structure(MQW) including a plurality of well layers with different compositions and thickness dimensions. With this constitution, sampling at necessary wavelength range and not a single wavelength become possible.</p> |
