发明名称 |
METHOD FOR MEASURING ACTING FORCE ON THIN PLATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for measuring an acting force using only one gauge amplifier by canceling the effect of offset moment based on a hardware when measuring the acting force on a thin plate using a strain gauge. SOLUTION: One side of an even thin plate is fixed, and arbitrary two places are selected on the thin plate. Two pairs of strain gauges, four gauges in total, are arranged at the points corresponding to front and rear parts of the places, respectively. A bridge circuit is formed between the strain gauges. A bending strain induced by an acting force applied to the thin plate is detected as an electric resistance change of each gauge for automatic calculation of it using the bridge circuit.
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申请公布号 |
JP2002214054(A) |
申请公布日期 |
2002.07.31 |
申请号 |
JP20010012209 |
申请日期 |
2001.01.19 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
UENO NAOHIRO;IKEDA KIICHI |
分类号 |
G01L1/22;G01N3/20;(IPC1-7):G01L1/22 |
主分类号 |
G01L1/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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