发明名称 METHOD FOR MEASURING ACTING FORCE ON THIN PLATE
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring an acting force using only one gauge amplifier by canceling the effect of offset moment based on a hardware when measuring the acting force on a thin plate using a strain gauge. SOLUTION: One side of an even thin plate is fixed, and arbitrary two places are selected on the thin plate. Two pairs of strain gauges, four gauges in total, are arranged at the points corresponding to front and rear parts of the places, respectively. A bridge circuit is formed between the strain gauges. A bending strain induced by an acting force applied to the thin plate is detected as an electric resistance change of each gauge for automatic calculation of it using the bridge circuit.
申请公布号 JP2002214054(A) 申请公布日期 2002.07.31
申请号 JP20010012209 申请日期 2001.01.19
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 UENO NAOHIRO;IKEDA KIICHI
分类号 G01L1/22;G01N3/20;(IPC1-7):G01L1/22 主分类号 G01L1/22
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