发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATING METHOD
摘要 PURPOSE: To provide a semiconductor device having such a structure as a short circuit does not take place between plug wirings even a void is generated in an insulation layer at the gap between wiring layers, and its fabricating method. CONSTITUTION: The method for fabricating a semiconductor device comprises a step for forming transfer gates 3 and 34 closely each other on a semiconductor substrate 1 through a gap 10, a step for filling the gap to cover a wiring layer, a step for opening a contact hole 11 in an insulation layer 8 at the gap part, a step for forming a short circuit preventive insulation film 5 in the contact hole, an etch back step for removing the short circuit preventive insulation film 5 at least on the bottom part of the gap to expose the semiconductor substrate 1, and a step for forming a plug wiring 12.
申请公布号 KR20020062796(A) 申请公布日期 2002.07.31
申请号 KR20010060585 申请日期 2001.09.28
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION 发明人 KOBAYASHI HEIJI;NAKAZAWA SHOICHIRO
分类号 H01L21/28;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/28
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