发明名称 FLAW INSPECTING DEVICE FOR TEST OBJECT
摘要 PROBLEM TO BE SOLVED: To devise mechanism structure of an inspecting device so that a surface flaw can be stably and accurately detected regardless of the outer shape and size of a test object. SOLUTION: The surface of the test object is photographed by an image pickup device, and the quality of the test object is determined by processing the obtained image data with an arithmetic device. A flaw device is provided with a drive mechanism adjusting the distance between the image pickup device and the test object and a range finder installed at a prescribed position against the image pickup device and measuring the distance between the image pickup device and the test object. The distance between the image pickup device and the test object is adjusted in a prescribed range based on the distance between the image pickup device and the test object obtained by the range finder to inspect the test object.
申请公布号 JP2002214155(A) 申请公布日期 2002.07.31
申请号 JP20010009428 申请日期 2001.01.17
申请人 RICOH CO LTD 发明人 NAKAYAMA OSAMU
分类号 G01B11/30;G01N21/952;(IPC1-7):G01N21/952 主分类号 G01B11/30
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