发明名称 Method and apparatus for verification of a circuit layout
摘要 A semiconductor integrated circuit layout figure, inclusive of dimensional accuracy depending on the pattern shape, is efficiently verified with high accuracy. A layout verifying method for verifying whether or not a layout figure conforms to a design rule on the basis of vector data includes a reference vector classifying step for selecting and classifying a reference vector which serves as a reference for verification among vectors corresponding to sides, a verification object vector classifying step for selecting and classifying a object vector to be verified among the vectors corresponding to the sides and a verifying step for verifying a distance between each reference vector and the object vector to be verified selected among the vectors to be verified classified in correspondence with the direction of the reference vector.
申请公布号 US6427225(B1) 申请公布日期 2002.07.30
申请号 US19990239148 申请日期 1999.01.28
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KITADA OSAMU;YAMASAKI TERUTOSHI;TAOKA HIRONOBU
分类号 G03F1/08;G03F1/68;G03F1/70;G03F1/84;G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G03F1/08
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