发明名称 |
Method and apparatus for verification of a circuit layout |
摘要 |
A semiconductor integrated circuit layout figure, inclusive of dimensional accuracy depending on the pattern shape, is efficiently verified with high accuracy. A layout verifying method for verifying whether or not a layout figure conforms to a design rule on the basis of vector data includes a reference vector classifying step for selecting and classifying a reference vector which serves as a reference for verification among vectors corresponding to sides, a verification object vector classifying step for selecting and classifying a object vector to be verified among the vectors corresponding to the sides and a verifying step for verifying a distance between each reference vector and the object vector to be verified selected among the vectors to be verified classified in correspondence with the direction of the reference vector. |
申请公布号 |
US6427225(B1) |
申请公布日期 |
2002.07.30 |
申请号 |
US19990239148 |
申请日期 |
1999.01.28 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KITADA OSAMU;YAMASAKI TERUTOSHI;TAOKA HIRONOBU |
分类号 |
G03F1/08;G03F1/68;G03F1/70;G03F1/84;G06F17/50;H01L21/82;(IPC1-7):G06F17/50 |
主分类号 |
G03F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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