发明名称 Buried metal dual damascene plate capacitor
摘要 A metal capacitor formed as part of metal dual damascene process in the BEOL, of a wafer. A lower plate (27) of the capacitor is sandwiched between an insulating layer (25) and a dielectric layer (29). The insulating layer on an opposite side abuts a layer of metalization (23, 24) and the dielectric layer separates the lower plate of the capacitor from an upper plate (59) of the capacitor. A portion (27A) of the lower plate projects into a via (37) adjacent to it that is filled with copper (63). The via projects up to a common surface with the upper plate but is electrically isolated form the upper plate. The via also extends down to the layer of metalization.
申请公布号 US6426249(B1) 申请公布日期 2002.07.30
申请号 US20000526354 申请日期 2000.03.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GEFFKEN ROBERT M.;STAMPER ANTHONY K.
分类号 H01L21/3205;H01L21/02;H01L21/768;H01L21/822;H01L23/522;H01L27/04;(IPC1-7):H01L21/824 主分类号 H01L21/3205
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